South Carolina firm Integrated Biometrics has revealed that it will be showcasing high-performance mobile ID technology at connect:ID 2015 in Washington, D.C. on 23-25 March.
The company will be giving a “sneak peek” at a new product to be released in the months ahead, and members of the company’s leadership team will be on hand to share best practices. The firm also plans to exhibit their Detective Series product line at the event including the Watson-Mini, Sherlock, and their new Columbo Desktop FAP PIV 30 Scanner.
Steve Thies
“New information presented at important events like connect:ID 2015 is essential to defining the future enhanced security needs of governments here in the U.S. and abroad. These needs become the basis for the new high performance solutions that emerge,” CEO Steve Thies said.
The firm added that the “premier international conference and exhibition” focuses on all aspects of personal identity and the opportunities for its management in both the physical and digital worlds, including the future of the identity credential, the impact of mobility, and the threats and opportunities posed by cyber security issues and big data.
Throughout connect:ID: 2015, Integrated Biometrics will be hosting several well-respected hardware integrators at Booth 208 such as Booz Allen Hamilton, NEC, Mobizent, Amrel, Coppernic, Corvus Biometrics, Credence ID, CrossMatch, Northrop Grumman, SIC Biometrics and SmartCore.
In January, Integrated Biometrics revealed that its ‘Sherlock’ fingerprint sensor has been successfully integrated into the VAMPIRE tactical forensic device from Booz Allen Hamilton. In the same month, it launched the Columbo Desktop FAP PIV 30 Scanner, saying it has applications in military, law enforcement, airport security, finance and healthcare “The Columbo Desktop has the largest area platen for a single finger scanner that the FBI recognizes,” said Steve Thies, Integrated Biometrics CEO, adding, “This particular size scanner is rare in the marketplace and is designed to perform at the highest level with tablets, smartphones and PCs.” Podcasts featuring members of the Integrated Biometrics team sharing their extensive up-to-date knowledgebase of technology trends and challenges for the enrollment verification industry are available on the company’s website.
connect:ID 2015 will be held at the Walter E Washington Convention Center, offering 50 exhibiting companies a chance to exchange ideas and source solutions along with an international lineup of speakers examining innovations in identification technology and biometrics. – See more at:
Fonte: http://www.planetbiometrics.com
